TY  - CONF
AU  - Ryan, Jason
AU  - Southwick, Richard
AU  - Campbell, Jason
AU  - Cheung, Kin
AU  - Suehle, John
C2  - IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA, US
DA  - 2013-01-31 00:01:00
LA  - en
PB  - IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA, US
PY  - 2013
TI  - Frequency Dependent Charge Pumping -- A Defect Depth Profiling Tool?
ER  -