TY  - GEN
AU  - Hudson, Lawrence T.
AU  - Glover, Jack Leigh
AU  - Minniti, Ronaldo
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2014-11-06 00:11:00
DO  - https://doi.org/10.6028/jres.119.021
LA  - en
M1  - 119
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2014
TI  - The Metrology of a Rastered Spot of X Rays used in Security Screening
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=916722
ER  -