TY  - CONF
AU  - Cheung, Kin
AU  - Campbell, Jason
AU  - Yu, Liangchun
C2  - 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), Shanghai, CN
DA  - 2010-11-01 00:11:00
LA  - en
PB  - 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), Shanghai, CN
PY  - 2010
TI  - Wafer-Level Magnetotransport Measurement of Advanced Transistors – Making a Powerful Technique Even More Powerful
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908457
ER  -