TY  - CONF
AU  - Ryan, Jason
AU  - Yu, Liangchun
AU  - Han, Jae
AU  - Kopanski, Joseph J.
AU  - Cheung, Kin
AU  - Zhang, Fei
AU  - Wang, C
AU  - Campbell, Jason
AU  - Suehle, John
AU  - Tilak, Vinayak
AU  - Fronheiser, Jody
C2  - Proceedings of the IEEE International Reliability Physics Symposium, Monterey, CA, US
DA  - 2011-04-12 00:04:00
DO  - https://doi.org/10.1109/irps.2011.5784477
LA  - en
PB  - Proceedings of the IEEE International Reliability Physics Symposium, Monterey, CA, US
PY  - 2011
TI  - A New Interface Defect Spectroscopy Method
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907880
ER  -