TY  - JOUR
AU  - Nguyen, Nhan Van
AU  - Kirillov, Oleg
AU  - Suehle, John
C2  - Thin Solid Films
DA  - 2010-12-10 00:12:00
LA  - en
M1  - 519
PB  - Thin Solid Films
PY  - 2010
TI  - Band Alignment of Metal-Oxide-Semiconductor Structure by Internal Photoemission Spectroscopy and Spectroscopic Ellipsometry
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907189
ER  -