TY  - JOUR
AU  - Maimon, Ory
AU  - Moser, Neil
AU  - Shrestha, Pragya
AU  - Kim, Minyeong
AU  - Koo, Sang-Mo
AU  - Liddy, Kyle
AU  - Green, Andrew
AU  - Chabak, Kelson
AU  - Pookpanratana, Sujitra
AU  - Li, Qiliang
C2  - IEEE Transactions on Electron Devices
DA  - 2026-04-07 04:04:00
DO  - https://doi.org/10.1109/TED.2026.3678479
LA  - en
M1  - 73
PB  - IEEE Transactions on Electron Devices
PY  - 2026
TI  - Impact of Deep-Level Traps on Carrier Mobility in β-Ga2O3 MOSFETs
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959460
ER  -