TY  - JOUR
AU  - Evans, R. Colby
AU  - Torsi, Riccardo
AU  - Kabos, Pavel
AU  - Holm, Jason
AU  - Killgore, Jason
AU  - Owiredu, Paul
AU  - Singh, Gurpreet
AU  - Sadowski, Jerzy
AU  - Walker, Angela Hight
AU  - Mansfield, Elisabeth
C2  - ACS Applied Electronic Materials
DA  - 2026-04-06 04:04:00
DO  - https://doi.org/10.1021/acsaelm.6c00080
LA  - en
PB  - ACS Applied Electronic Materials
PY  - 2026
TI  - Characterization of Electronic Stress-Induced Changes in Multi-Layer MoS2
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=960984
ER  -