TY  - JOUR
AU  - Raunak, M S
AU  - Kuhn, David
AU  - Kacker, Raghu
C2  - IEEE Reliability Magazine
DA  - 2025-06-09 04:06:00
LA  - en
PB  - IEEE Reliability Magazine
PY  - 2025
TI  - Ensuring Reliability through Combinatorial Sequence Coverage
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=960007
ER  -