TY  - GEN
AU  - Srinivasan, Vijay
C2  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2026-02-25 05:02:00
DO  - https://doi.org/10.6028/NIST.AMS.100-77
LA  - en
PB  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2026
TI  - On the Physical Interpretation of Adjoint Methods for Sensitivity Analysis, Part I: Self-Adjoint Linear Systems
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=961492
ER  -