TY  - CONF
AU  - Duong, Tam
AU  - Kumar, Ashish
AU  - Ortiz, Jose
AU  - Bhattacharya, Subhashish
AU  - Veliadi, Victor
AU  - Waltrip, Bryan C.
C2  - 2019 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, US
DA  - 2020-04-01 04:04:00
LA  - en
PB  - 2019 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, US
PY  - 2020
TI  - Physics-based Electro-thermal Saber Model Validation for 3.3 kV, 45 A 4H-SiC MOSFET in Medium Voltage Power Converters
ER  -