TY  - JOUR
AU  - Hacker, Christina
AU  - McGinn, Christine
AU  - Glasmann, Andreu
AU  - Sarney, Wendy
AU  - Najmaei, Sina
C2  - IEEE Circuits & Devices
DA  - 2025-11-01 04:11:00
DO  - https://doi.org/10.1109/TED.2025.3611907
LA  - en
M1  - 72
PB  - IEEE Circuits & Devices
PY  - 2025
TI  - Analysis of Short-Channel Hafnia-Based FeFET Device Variability Guided by Piezoresponse Force Microscopy
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959922
ER  -