TY  - JOUR
AU  - Ridzel, Olga
AU  - Holland, Glenn
AU  - Villarrubia, John
C2  - Microscopy and Microanalysis
DA  - 2025-07-25 04:07:00
DO  - https://doi.org/10.1093/mam/ozaf048.265
LA  - en
M1  - 31 
PB  - Microscopy and Microanalysis
PY  - 2025
TI  - Measurements of Secondary Electron Yield for Validation of Scanning Electron Microscopy Models
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959621
ER  -