TY  - CONF
AU  - Oleshko, Vladimir
AU  - Holland, Glenn
AU  - Westly, Daron
AU  - Villarrubia, John
C2  - Microscopy & Microanalysis 2025, Proceedings of the MSA/MAS Annual Meeting, July 27-31, 2025, Salt Lake City, Utah, Slat Lake City, UT, US
DA  - 2025-07-25 04:07:00
DO  -  https://doi.org/10.1093/mam/ozaf048.272
LA  - en
M1  - 31
PB  - Microscopy & Microanalysis 2025, Proceedings of the MSA/MAS Annual Meeting, July 27-31, 2025, Salt Lake City, Utah, Slat Lake City, UT, US
PY  - 2025
TI  - Large Area Real-Space Crystallography and Thickness Determination of Mesoscopic Semiconductor Membranes Using Zone Axis Patterns, Cold Field-Emission SEM/STEM, and Analytical S/TEM
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959536
ER  -