TY - JOUR AU - Wen, Yu Xin AU - Tsui, Bing-Yue AU - Cheung, Kin C2 - Microelectronics Reliability DA - 2025-07-02 04:07:00 DO - https://doi.org/10.1016/j.microrel.2025.115841 LA - en M1 - 173 PB - Microelectronics Reliability PY - 2025 TI - Impact of near interface defects on NO annealed SiC MOSFET mobility UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959480 ER -