TY  - GEN
AU  - Obeng, Yaw
AU  - Obrzut, Jan
AU  - Bedner, Mary
C2  - OTHER, National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2025-06-27 04:06:00
DO  - https://doi.org/10.6028/NIST.CHIPS.1400-3
LA  - en
PB  - OTHER, National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2025
TI  - Summary Report: CHIPS R&D Semiconductor Supply Chain Trust and Assurance Data Standards & Digital Twin Data Interoperability Standards Workshops
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959986
ER  -