TY  - JOUR
AU  - Rufenacht, Alain
AU  - Fox, Anna
AU  - Johnson, Raegan
AU  - Scheck, Benjamin
AU  - Dresselhaus, Paul
AU  - Benz, Samuel
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2025-03-14 04:03:00
DO  - https://doi.org/10.1109/TIM.2025.3551579
LA  - en
M1  - 74
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2025
TI  - Dual-Frequency-Bias Programmable Josephson Voltage Standard Circuit
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=958935
ER  -