TY  - JOUR
AU  - Shrestha, Pragya
AU  - Zaslavsky, Alexander
AU  - Jimenez, Valery Ortiz
AU  - Campbell, Jason
AU  - Richter, Curt
C2  - IEEE Journal of the Electron Devices Society
DA  - 2025-03-31 04:03:00
DO  - https://doi.org/10.1109/JEDS.2025.3552036
LA  - en
M1  - 13
PB  - IEEE Journal of the Electron Devices Society
PY  - 2025
TI  - Impact-Ionization-Based High-Endurance One-Transistor Bulk CMOS Cryogenic Memory
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957733
ER  -