TY  - GEN
AU  - Kahn, Jason
C2  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2025-05-21 04:05:00
DO  - https://doi.org/10.6028/NIST.IR.8577
LA  - en
PB  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2025
TI  - Semiconductors and Microelectronics Standards Working Group Annual Report for 2024
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959453
ER  -