TY  - JOUR
AU  - Hoogerheide, David
AU  - Heinrich, Frank
C2  - Journal of Applied Crystallography
DA  - 2024-08-01 04:08:00
DO  - https://doi.org/10.1107/S1600576724006447
LA  - en
M1  - 57
PB  - Journal of Applied Crystallography
PY  - 2024
TI  - AutoRefl: Active Learning in Neutron Reflectometry for Fast Data Acquisition
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957972
ER  -