TY  - GEN
AU  - Jason Kahn
AU  - Chris Greer
C2  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2023-12-05 05:12:00
DO  - https://doi.org/10.6028/NIST.IR.8501
LA  - en
PB  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2023
TI  - Semiconductors and Microelectronics Standards, Report of the Semiconductors and Microelectronics Working Group
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956962
ER  -