TY  - JOUR
AU  - Prashansa Mukim
AU  - Pragya Shrestha
AU  - Advait Madhavan
AU  - Nitin Prasad
AU  - Jason Campbell
AU  - Forrest Brewer
AU  - Mark Stiles
AU  - Jabez J. McClelland
C2  - IEEE Electron Device Letters
DA  - 2023-07-12 04:07:00
DO  - https://doi.org/10.1109/LED.2023.3294722
LA  - en
M1  - 44
PB  - IEEE Electron Device Letters
PY  - 2023
TI  - Characterization of Noise in CMOS Ring Oscillators at Cryogenic Temperatures
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936783
ER  -