TY  - CONF
AU  - Seulki Cho
AU  - Alexander Zaslavsky
AU  - Curt A. Richter
AU  - Jacob Majikes
AU  - James Alexander Liddle
AU  - François Andrieu
AU  - Sylvain Barraud
AU  - Arvind Balijepalli
C2  - Proceedings of the IEEE Electron Device Meeting, San Francisco, CA, US
DA  - 2023-01-23 05:01:00
LA  - en
PB  - Proceedings of the IEEE Electron Device Meeting, San Francisco, CA, US
PY  - 2023
TI  - High-Resolution DNA Hybridization Kinetics Measurements with Double Gate FD-SOI Transistors
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935166
ER  -