TY  - JOUR
AU  - Kin (Charles) Cheung
C2  - Journal of Applied Physics
DA  - 2023-06-16 04:06:00
DO  - https://doi.org/10.1063/5.0146394
LA  - en
M1  - 133
PB  - Journal of Applied Physics
PY  - 2023
TI  - A non-defect precursor gate oxide breakdown model
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935952
ER  -