TY  - CONF
AU  - Kin (Charles) Cheung
C2  - 2023 IEEE International Reliability Physics Symposium, Monterey, CA, US
DA  - 2023-05-15 04:05:00
DO  - https://doi.org/10.1109/IRPS48203.2023.10118184
LA  - en
PB  - 2023 IEEE International Reliability Physics Symposium, Monterey, CA, US
PY  - 2023
TI  - V-Ramp test and gate oxide screening under the "lucky" defect model
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935744
ER  -