TY  - GEN
AU  - Wilson, C L
AU  - Watson, C I
AU  - Paek, E G
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1998-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6184
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1998
TI  - Effect of resolution and image quality on combined optical and neural network fingerprint matching:
ER  -