TY  - GEN
AU  - Dolores R Wallace
AU  - D Richard Kuhn
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1999-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6407
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1999
TI  - Software quality lessons from medical device failure data:
ER  -