TY  - GEN
AU  - Vaerenbergh, S Van
AU  - Coriell, S R
AU  - McFadden, G B
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2000-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6586
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2000
TI  - Morphological stability of a binary alloy::temperature-dependent diffusivity
ER  -