TY  - GEN
AU  - Theofanos, Mary
AU  - Stanton, Brian
AU  - Sheppard, Charles
AU  - Micheals, Ross
AU  - Zhang, Nien-Fan
AU  - Wydler, John
AU  - Nadel, Larry
AU  - Rubin, William
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2008-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.7504
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2008
TI  - Usability testing of height and angles of ten-print fingerprint capture:
ER  -