TY  - GEN
AU  - Elham Tabassi
AU  - Patrick Grother
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2008-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.7544
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2008
TI  - Biometric quality ::the last 1% : biometric quality assessment for error suppression
ER  -