TY  - GEN
AU  - P J Phillips
AU  - H A Sahibzada
AU  - Patrick J Flynn
AU  - K W Bowyer
AU  - A O'Toole
AU  - S Weimer
AU  - J R Beveridge
AU  - B Draper
AU  - D Bolme
AU  - G H Givens
AU  - Y M Lui
AU  - J A Scallan
AU  - W T Scruggs
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2009-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.7607
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2009
TI  - Overview of the multiple biometrics grand challenge:
ER  -