TY  - GEN
AU  - Yee-Yin Choong
AU  - Mary Theofanos
AU  - Brian Stanton
AU  - Patrick Hofmann
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2009-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.7645
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2009
TI  - Symbols representing biometrics in use:
ER  -