TY  - GEN
AU  - Cheng, Su Lan
AU  - Micheals, Ross J
AU  - Lu, Z Q John
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2010-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.7740
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2010
TI  - Comparison of confidence intervals for large operational biometric data by parametric and non-parametric methods:
ER  -