TY  - GEN
AU  - Rennex, Brian G
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1994-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.SP.260-121
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1994
TI  - Standard Reference Materials ::Certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry/
ER  -