TY  - GEN
AU  - Marshall, J C
AU  - Mattis, R L
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1992-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.SP.400-90
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1992
TI  - Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2:
ER  -