TY  - GEN
AU  - Fernando L Podio
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1991-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.SP.500-200
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1991
TI  - Development of a testing methodology to predict optical disk life expectancy values:
ER  -