TY  - GEN
AU  - Sawyer, D E
AU  - Rogers, G J
AU  - Huntley, L E
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1973-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.73-152
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1973
TI  - Measurement of transit time and related transistor characteristics:
ER  -