TY  - GEN
AU  - Tong, Tommy C
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1973-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.73-310
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1973
TI  - Electromagnetic scattering by a thin wire with continuous impedance loading-- part II ::time domain analysis
ER  -