TY  - GEN
AU  - Oettinger, F F
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1979-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.79-1756
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1979
TI  - Measurement techniques for high power semiconductor materials and devices ::annual report, October 1, 1977 to September 30, 1978
ER  -