TY  - GEN
AU  - Hebner, R E
AU  - Kelley, E F
AU  - Thompson, J E
AU  - Sudarshan, T
AU  - Jones, T B
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1981-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.81-2275
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1981
TI  - 1980 annual report ::optical measurements for interfacial conduction and breakdown
ER  -