TY  - GEN
AU  - Wiederhorn, S M
AU  - Frieman, S W
AU  - Fuller, E R
AU  - Simmons, C J
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1982-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.82-2524
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1982
TI  - Effects of water and other dielectrics on crack growth:
ER  -