TY  - GEN
AU  - Christ, Bruce W
AU  - Polvani, Robert S
AU  - Hocken, Robert J
AU  - Borchardt, Bruce
AU  - Charlton, Tom
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1982-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.82-2542
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1982
TI  - Micromechanical properties of beryllium and other instrument materials:
ER  -