TY  - GEN
AU  - Kathryn E Kline
AU  - Mary E DeWeese
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1985-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.85-3029
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1985
TI  - metrology for electromagnetic technology ::a bibliography of NBS publications
ER  -