TY  - GEN
AU  - Kelly, James F
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1987-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.87-3681
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1987
TI  - Application of optical image analysis to quantitative microstructure characterization of composite materials:
ER  -