TY  - GEN
AU  - Stromberg, R R
AU  - Passaglia, E
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1964-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.MP.256
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1964
TI  - Ellipsometry in the measurement of surfaces and thin films ::symposium proceedings Washington 1963/
ER  -