TY  - GEN
AU  - Richard Flitsch
AU  - Robert Alvarez
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1965-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.SP.260-5
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1965
TI  - Standard Reference Materials ::Accuracy of solution x-ray spectrometric analysis of copper-base alloys/
ER  -