TY  - GEN
AU  - James R Ehrstein
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1985-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.SP.260-93
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1985
TI  - Standard Reference Materials ::Preparation and certification of SRM's for calibration of spreading resistance probes/
ER  -