TY  - GEN
AU  - Sawyer, David E
AU  - Berning, David W
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1976-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.SP.400-27
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1976
TI  - Laser scanning of active semiconductor devices-videotape script:
ER  -