TY  - GEN
AU  - Cohen, Elaine C
AU  - Ruthberg, Stanley
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1982-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.SP.400-72
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1982
TI  - NBSRADC workshop moisture measurement technology for hermetic semiconductor devices II:
ER  -