TY  - GEN
AU  - Wilson, Charles L
AU  - Blue, James L
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1985-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.SP.400-77
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1985
TI  - MOS1 a program for two-dimensional analysis of Si MOSFETs:
ER  -