TY - GEN AU - John M Evans AU - Russell Kirsch AU - Roger N Nagel C2 - , National Institute of Standards and Technology, Gaithersburg, MD DA - 1977-01-01 05:01:00 DO - https://doi.org/10.6028/NBS.SP.500-8 LA - en PB - , National Institute of Standards and Technology, Gaithersburg, MD PY - 1977 TI - Workshop on standards for image pattern recognition: ER -